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Proceedings Paper

Non-uniform sampling knife-edge method for camera modulation transfer function measurement
Author(s): Yaxuan Duan; Xun Xue; Yongquan Chen; Liude Tian; Jianke Zhao; Limin Gao
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Paper Abstract

Traditional slanted knife-edge method experiences large errors in the camera modulation transfer function (MTF) due to tilt angle error in the knife-edge resulting in non-uniform sampling of the edge spread function. In order to resolve this problem, a non –uniform sampling knife-edge method for camera MTF measurement is proposed. By applying a simple direct calculation of the Fourier transform of the derivative for the non-uniform sampling data, the camera super-sampled MTF results are obtained. Theoretical simulations for images with and without noise under different tilt angle errors are run using the proposed method. It is demonstrated that the MTF results are insensitive to tilt angle errors. To verify the accuracy of the proposed method, an experimental setup for camera MTF measurement is established. Measurement results show that the proposed method is superior to traditional methods, and improves the universality of the slanted knife-edge method for camera MTF measurement.

Paper Details

Date Published: 24 November 2016
PDF: 9 pages
Proc. SPIE 10023, Optical Metrology and Inspection for Industrial Applications IV, 100231C (24 November 2016); doi: 10.1117/12.2245840
Show Author Affiliations
Yaxuan Duan, Xi’an Institute of Optics and Precision Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Xun Xue, Xi'an Institute of Optics and Precision Mechanics (China)
Yongquan Chen, Xi'an Institute of Optics and Precision Mechanics (China)
Liude Tian, Xi'an Institute of Optics and Precision Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Jianke Zhao, Xi'an Institute of Optics and Precision Mechanics (China)
Limin Gao, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 10023:
Optical Metrology and Inspection for Industrial Applications IV
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

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