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Proceedings Paper

Specular gloss scales comparison between the SIMT and the NIST
Author(s): Dejin Yin; Tiecheng Li; Biyong Huang; Weihai Cheng; Fangsheng Lin
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Paper Abstract

Specular gloss is the fraction of light reflected in the specular direction for specified incident and receptor apertures, it is the perception by an observer of the mirror-like appearance of a surface. The measurement of specular gloss consists of comparing the luminous reflectance from a test sample to that from a calibrated gloss standard which generally is a polished piece of black glass, under the same experimental conditions. Gloss is a dimensionless quantity whose accurate determination requires standardized experimental conditions such as spectral distribution of the incident beam of light, incident and viewing angles, and a gloss standard. The Shanghai Institute of Measurement and Testing Technology (SIMT) provides test service to calibrate gloss reference standards. This facility is built around a reference goniophotometer, containing an instrument that measures flux as a function of angles of illumination or observation and a primary gloss standard, which is a piece of three wedges of highly polished, high-quality optical glass. The system has an overall (k=2) uncertainty of 0.5 Gloss Unit(GU). The service offers calibration measurements of working gloss standards at the geometries of 20°, 60°, and 85°, in compliance with the ISO 2813 and the ASTM D523 documentary standards. This article describes a bilateral comparison of specular gloss scales between SIMT and the National Institute of Standards and Technology (NIST) that has been performed. The results of this comparison show agreement within the combined uncertainties for the measurement of specular gloss of highly polished black glass.

Paper Details

Date Published: 27 September 2016
PDF: 8 pages
Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96841Y (27 September 2016); doi: 10.1117/12.2245745
Show Author Affiliations
Dejin Yin, Shanghai Institute of Measurement and Testing Technology (China)
Tiecheng Li, Shanghai Institute of Measurement and Testing Technology (China)
Biyong Huang, Shanghai Institute of Measurement and Testing Technology (China)
Weihai Cheng, Shanghai Institute of Measurement and Testing Technology (China)
Fangsheng Lin, Shanghai Institute of Measurement and Testing Technology (China)


Published in SPIE Proceedings Vol. 9684:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Yudong Zhang; Fan Wu; Ming Xu; Sandy To, Editor(s)

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