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Proceedings Paper

Rail profile control using laser triangulation scanners
Author(s): Аlexandr M. Boronahin; Daniil Yu. Larionov; Liudmila N. Podgornaya; Roman V. Shalymov; Yuri V. Filatov; Evgueny D. Bokhman
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Paper Abstract

Rail track geometric parameters measurement requires knowledge of left and right rail head location in each section. First of all displacement in transverse plane of rail head point located at a distance of 14 mm below the running surface, must be controlled [1]. It is carried out by detecting of each rail profile using triangulation laser scanners. Optical image recognition is carried out successfully in the laboratory, approaches used for this purpose are widely known. However, laser scanners operation has several features on railways leading to necessity of traditional approaches adaptation for solving these particular problems. The most significant problem is images noisiness due to the solar flashes and the effect of "Moon path" on the smooth rail surface. Using of optical filters gives inadequate result, because scanner laser diodes radiation frequency varies with temperature changes that forbid the use of narrow-band filters. Consideration of these features requires additional constructive and algorithmic solutions, including involvement of information from other sensors of the system. The specific usage of optical scanners for rail profiles control is the subject of the paper.

Paper Details

Date Published: 24 November 2016
PDF: 8 pages
Proc. SPIE 10023, Optical Metrology and Inspection for Industrial Applications IV, 100231B (24 November 2016); doi: 10.1117/12.2245736
Show Author Affiliations
Аlexandr M. Boronahin, St. Petersburg State Electrotechnical Univ. (Russian Federation)
Daniil Yu. Larionov, St. Petersburg State Electrotechnical Univ. (Russian Federation)
Liudmila N. Podgornaya, St. Petersburg State Electrotechnical Univ. (Russian Federation)
Roman V. Shalymov, St. Petersburg State Electrotechnical Univ. (Russian Federation)
Yuri V. Filatov, St. Petersburg State Electrotechnical Univ. (Russian Federation)
Evgueny D. Bokhman, St. Petersburg State Electrotechnical Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 10023:
Optical Metrology and Inspection for Industrial Applications IV
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

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