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Proceedings Paper

Application of image stitching in rail abrasion 3D online detection
Author(s): Jinlong Lee; Xiaorong Gao; Zeyong Wang; Quanke Zhao; Lin Luo
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Paper Abstract

PMP (Phase measuring Profilometry) is an excellent 3D online measurement method for its high precision. However, the measuring range is limited. While the rail is so long that far exceeds the measuring limit, the image stitching should be used to extent it. In this paper, based on the improved Stoilov algorithm, the rail shape is three-dimensionally reconstructed and the abrasion is detected combines image stitching. Two types of schemes are researched: (1)image stitching is firstly used on the deformed fringe patterns and then a larger range rail is constructed with Stoilov algorithm; (2)the three-dimensional construction of two fringe pattern is firstly performed, and then the constructed images are stitched into longer rail. In this paper, the improved Stoilov algorithm based on statistical approach and stitching algorithm are analyzed. 3D Peaks function is simulated to verify the two methods, and then three-dimensional rail shape is recovered based on these two methods and the rail abrasion is measured with the relative precision of higher than 0.1%, which is much higher than traditional methods, such as linear laser scanning.

Paper Details

Date Published: 27 September 2016
PDF: 9 pages
Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96841Z (27 September 2016); doi: 10.1117/12.2245679
Show Author Affiliations
Jinlong Lee, Southwest Jiaotong Univ. (China)
Xiaorong Gao, Southwest Jiaotong Univ. (China)
Zeyong Wang, Southwest Jiaotong Univ. (China)
Quanke Zhao, Southwest Jiaotong Univ. (China)
Lin Luo, Southwest Jiaotong Univ. (China)


Published in SPIE Proceedings Vol. 9684:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Yudong Zhang; Fan Wu; Ming Xu; Sandy To, Editor(s)

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