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Proceedings Paper

A low radiation optical system with lens positioned inside of the infrared detector Dewar
Author(s): Jun Zhou; Zheng Zhen; Yingrui Wang; Juan Li; Wen Ou; Ang Li; Jian Xiong
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Paper Abstract

For the far distance and weak signal detecting, low background noise is essential. Because the spatial noise of infrared system is mostly determined by spontaneous thermal radiation, it is the most directly method to achieve low spatial noise by refrigerating optics. This paper introduced a low radiation optical system with lens positioned inside of the infrared detector Dewar. The system includes two parts: the two mirror Cassegrain system working at room temperature which images the intermediate focus (IF) and the lens positioned inside of infrared detector Dewar which image the IF to focal plane. The working temperature inside of the infrared detector Dewar is 80K, the cryogenic lens contain three pieces lens whose total weight is below 5g. In view of engineering application, the low radiation optical system, the stray light analysis, cryogenic optics mounting and system testing were discussed. Calculations indicate that the equivalent blackbody radiation temperature (EBRT) is less than 180K.

Paper Details

Date Published: 25 October 2016
PDF: 7 pages
Proc. SPIE 9685, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials, 968507 (25 October 2016); doi: 10.1117/12.2245573
Show Author Affiliations
Jun Zhou, Beijing Institute of Remote Sensing Equipment (China)
Zheng Zhen, Beijing Institute of Remote Sensing Equipment (China)
Yingrui Wang, Beijing Institute of Remote Sensing Equipment (China)
Juan Li, Beijing Institute of Remote Sensing Equipment (China)
Wen Ou, Beijing Institute of Remote Sensing Equipment (China)
Ang Li, Beijing Institute of Remote Sensing Equipment (China)
Jian Xiong, Beijing Institute of Remote Sensing Equipment (China)


Published in SPIE Proceedings Vol. 9685:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials
Xiangang Luo; Tianchun Ye; Tingwen Xin; Song Hu; Minghui Hong; Min Gu, Editor(s)

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