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Proceedings Paper

Traceable quantum sensing and metrology relied up a quantum electrical triangle principle
Author(s): Yan Fang; Hengliang Wang; Xinju Yang; Jingsong Wei
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Paper Abstract

Hybrid quantum state engineering in quantum communication and imaging1-2 needs traceable quantum sensing and metrology, which are especially critical to quantum internet3 and precision measurements4 that are important across all fields of science and technology-. We aim to set up a mode of traceable quantum sensing and metrology. We developed a method by specially transforming an atomic force microscopy (AFM) and a scanning tunneling microscopy (STM) into a conducting atomic force microscopy (C-AFM) with a feedback control loop, wherein quantum entanglement enabling higher precision was relied upon a set-point, a visible light laser beam-controlled an interferometer with a surface standard at z axis, diffractometers with lateral standards at x-y axes, four-quadrant photodiode detectors, a scanner and its image software, a phase-locked pre-amplifier, a cantilever with a kHz Pt/Au conducting tip, a double barrier tunneling junction model, a STM circuit by frequency modulation and a quantum electrical triangle principle involving single electron tunneling effect, quantum Hall effect and Josephson effect5. The average and standard deviation result of repeated measurements on a 1 nm height local micro-region of nanomedicine crystal hybrid quantum state engineering surface and its differential pA level current and voltage (dI/dV) in time domains by using C-AFM was converted into an international system of units: Siemens (S), an indicated value 0.86×10-12 S (n=6) of a relative standard uncertainty was superior over a relative standard uncertainty reference value 2.3×10-10 S of 2012 CODADA quantized conductance6. It is concluded that traceable quantum sensing and metrology is emerging.

Paper Details

Date Published: 3 November 2016
PDF: 9 pages
Proc. SPIE 10029, Quantum and Nonlinear Optics IV, 100290C (3 November 2016); doi: 10.1117/12.2245556
Show Author Affiliations
Yan Fang, Fudan Univ. (China)
Hengliang Wang, Fudan Univ. (China)
Xinju Yang, Fudan Univ. (China)
Jingsong Wei, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 10029:
Quantum and Nonlinear Optics IV
Qihuang Gong; Guang-Can Guo; Byoung Seung Ham, Editor(s)

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