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Proceedings Paper

Nanomanipulation device fabrication: multilayerd graphene and OFET devices
Author(s): C. Coleman; S. Khorasani; S. Ncube; D. Mtsuko; C. Botha; C. Sandrock; M. Fernandes; D. Levendis; S. Bhattacharyya
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Paper Abstract

We utilize nano-manipulting probes for the fabrication of a range of devices including multilayered graphene coplanar waveguides, suspended multilayered graphene hall bars and air-gap single crystal organic field effect transistors. We find that devices fabricated using this technique are of high quality and can be used to probe not only application based phenomena (such as transistor behaviour), but also fundamental quantum transport properties. Magnetoresistance measurements show that the multilayered graphene devices exhibit either quantum linear magnetoresistance (QLMR) or Shubnikov de-Haas oscillations depending on the topology (i.e. either wrinkled or smooth) of the graphene sheet. From this data we calculate the carrier density (ns) in the wrinkled graphene to be in the range 5.2 × 109 cm-2 (at B~0) to 3.5 × 1013 cm-2 (at B=12 T) with effective masses of 0.001me and 0.121me, respectively. The smooth multilayer graphene devices have a carrier density 1.39 - 2.85 × 1012 cm-2 and effective mass (0.022mem*≤ 0.032me) as calculated from the analysis of the Shubnokov de-Haas oscillations. The high frequecny coplanar waveguide devices fabricated using this technique demonstrated high transmission up to 50 GHz, highlighting the potential for HF application. Organic field effect transistors were also fabricated using the manipulation technique, the transfere characteristics were measured, it was found that the devcies with channel length of 1 μm have non-linear transfere characterisitcs and pass a maximum current of between 0.1 and 10 nA. These OFET devices showed pronounced switching behaviour with mobilities of up to 3 cm2V-1s-1 in the best devices.

Paper Details

Date Published: 3 February 2017
PDF: 13 pages
Proc. SPIE 10036, Fourth Conference on Sensors, MEMS, and Electro-Optic Systems, 1003608 (3 February 2017); doi: 10.1117/12.2245446
Show Author Affiliations
C. Coleman, Univ. of the Witwatersrand (South Africa)
S. Khorasani, Univ. of the Witwatersrand (South Africa)
S. Ncube, Univ. of the Witwatersrand (South Africa)
D. Mtsuko, Univ. of the Witwatersrand (South Africa)
C. Botha, Orbilectron Consulting (Pty) Ltd. (South Africa)
C. Sandrock, Univ. of the Witwatersrand (South Africa)
M. Fernandes, Univ. of the Witwatersrand (South Africa)
D. Levendis, Univ. of the Witwatersrand (South Africa)
S. Bhattacharyya, Univ. of the Witwatersrand (South Africa)


Published in SPIE Proceedings Vol. 10036:
Fourth Conference on Sensors, MEMS, and Electro-Optic Systems
Monuko du Plessis, Editor(s)

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