Share Email Print
cover

Proceedings Paper

Phase-independent multilayer defect repair for EUV photomasks
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

EUV mask repair techniques have primarily focused on absorber biasing to recover the imaging contrast loss originating from multilayer blank defects, while exploratory efforts have investigated local multilayer modification for compensating any through-focus Bossung asymmetry. The work here evaluates these repair techniques and attempts to expand upon them through finite-difference time-domain (FDTD) simulations. In particular, the possibility of local material deposition as an added repair technique is considered, and the interactions between various compensation strategies and illumination modes are explored. A multilayer defect repair methodology that is non-disruptive to the multilayer stack is introduced for the recovery of both the amplitude loss and phase error originating from native blank defects. The effectiveness of the compensation technique is shown to be independent of the defect type, providing a repair solution that is impartial to the phase offset induced by the multilayer defect. Significant lithographic process window improvements are reported, as compared to conventional absorber-based repair, attributed primarily to the restoration of symmetric printing behavior through defocus. This provides an alternative, viable approach to HVM multilayer defect repair.

Paper Details

Date Published: 4 October 2016
PDF: 12 pages
Proc. SPIE 9985, Photomask Technology 2016, 998517 (4 October 2016); doi: 10.1117/12.2245442
Show Author Affiliations
Shuo Zhao, GLOBALFOUNDRIES Inc. (United States)
Zhengqing John Qi, GLOBALFOUNDRIES Inc. (United States)


Published in SPIE Proceedings Vol. 9985:
Photomask Technology 2016
Bryan S. Kasprowicz; Peter D. Buck, Editor(s)

© SPIE. Terms of Use
Back to Top