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Proceedings Paper

Measurement of optical system aberrations based on randomly encoded hybrid grating
Author(s): Jiabin Jiang; Tong Ling; Yongying Yang; Rui Zhang
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Paper Abstract

A lateral shearing interferometer based on randomly encoded hybrid grating (REHG) is proposed to measure the optical system aberrations. According to the theory of Fraunhofer diffraction, the REHG is designed to be a combination of a randomly encoded binary amplitude grating and a phase chessboard. Compared with the conventional cross-grating lateral shearing interferometer, the REHG is more suitable for the general aberration testing since no order selection mask is needed. Collimated beam for aberration measurement will converge after passing through the optics system under test. Then the quadriwave lateral shearing interferogram containing the wave-front aberration information is then recorded by the CCD. By selecting its +1 order of the Fourier spectrum in both X and Y directions, the shearing wavefronts in both two orthogonal directions can be obtained employing phase unwarping algorithm. Zernike polynomials are used as basic functions for the original wave-front, and the coefficients of Zernike polynomials can be obtained with shearing wave-fronts. In the experiment, we employed a REHG with a grating pitch of 240μm to test a cemented doublet optics with an aperture of 50mm and a focal lengths of 90mm. The test results showed the peak-to-valley (PTV) aberration is 0.242λ while the root-mean-square (RMS) is 0.064λ. The test results by the REHG are very close to the results by the ZYGO GPI interferometer while the error of PTV is 0.003λ and the error of RMS is 0.007λ. The measurement of optical system aberrations by REHG can reach high precision and exhibit good immunity to environmental disturbance. The REHG can be applied to the optical testing of beam quality, optical system aberration and biomedical research.

Paper Details

Date Published: 31 October 2016
PDF: 7 pages
Proc. SPIE 10021, Optical Design and Testing VII, 100210V (31 October 2016); doi: 10.1117/12.2245327
Show Author Affiliations
Jiabin Jiang, Zhejiang Univ. (China)
Tong Ling, Zhejiang Univ. (China)
Yongying Yang, Zhejiang Univ. (China)
Rui Zhang, Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 10021:
Optical Design and Testing VII
Yongtian Wang; Tina E. Kidger; Kimio Tatsuno, Editor(s)

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