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Proceedings Paper

Improved manufacturability of high-laser damage threshold ion-beam deposited HfO2/SiO2 filters
Author(s): Sandeep Kohli; Ralf H. Erz; Jason M. George; Adrian Devasahayam
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Proc. SPIE 10014, Laser-Induced Damage in Optical Materials 2016, ; doi: 10.1117/12.2245320
Show Author Affiliations
Sandeep Kohli, Veeco Instruments Inc. (United States)
Ralf H. Erz, Veeco Instruments Inc. (United States)
Jason M. George, Veeco Instruments Inc. (United States)
Adrian Devasahayam, Veeco Instruments Inc. (United States)


Published in SPIE Proceedings Vol. 10014:
Laser-Induced Damage in Optical Materials 2016
Greg J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau, Editor(s)

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