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Proceedings Paper

Studies of defects in diamond films and particles by Raman and luminescence spectroscopies
Author(s): Lawrence H. Robins; Edward N. Farabaugh; Albert Feldman
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Paper Abstract

Diamond films grown under a variety of deposition conditions in hot-filament or microwave-plasma CVD reactors were characterized by Raman and cathodoluminescence (CL) spectroscopies. The magnitudes of the following four Raman spectral features were observed to vary from specimen to specimen in a correlated manner: (1) the linewidth of the diamond Raman line (2) the intensity of the tails of the diamond Raman line at several half-widths from the peak (3) the intensity ratio of the sp2-bonded carbon Raman band to the diamond Raman line and (4) the intensity ratio of the broad photoluminescence (PL) background that underlies the Raman spectrum to the diamond Raman peak. We suggest that each of these features varies with the abundance of sp2-bonded carbon. As a function of deposition conditions the sp2-bonded carbon content increases with methane fraction and with substrate temperature and decreases with oxygen fraction. A cyclic variation with deposition time is observed for one set of hot-filament depositions. The CL spectra of these specimens consist of several distinct components attributed to impurities point defects and dislocations. The CL intensity is found to be vary from specimen to specimen approximately inversely with the intensity of the visible-excited PL background in the Raman region. This correlation is strongest for the dislocation-related 2. 85 eV CL band. A model of competing recombination between two sets of defects is proposed to explain the inverse correlation. 1 .

Paper Details

Date Published: 1 December 1990
PDF: 12 pages
Proc. SPIE 1325, Diamond Optics III, (1 December 1990); doi: 10.1117/12.22452
Show Author Affiliations
Lawrence H. Robins, National Institute of Standards and Technology (United States)
Edward N. Farabaugh, National Institute of Standards and Technology (United States)
Albert Feldman, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 1325:
Diamond Optics III
Albert Feldman; Sandor Holly, Editor(s)

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