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Proceedings Paper

Updates on measurements and modeling techniques for expendable countermeasures
Author(s): Robert Gignilliat; Kathleen Tepfer; Rebekah F. Wilson; Thomas M. Taczak
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Paper Abstract

The potential threat of recently-advertised anti-ship missiles has instigated research at the United States (US) Naval Research Laboratory (NRL) into the improvement of measurement techniques for visual band countermeasures. The goal of measurements is the collection of radiometric imagery for use in the building and validation of digital models of expendable countermeasures. This paper will present an overview of measurement requirements unique to the visual band and differences between visual band and infrared (IR) band measurements. A review of the metrics used to characterize signatures in the visible band will be presented and contrasted to those commonly used in IR band measurements. For example, the visual band measurements require higher fidelity characterization of the background, including improved high-transmittance measurements and better characterization of solar conditions to correlate results more closely with changes in the environment. The range of relevant engagement angles has also been expanded to include higher altitude measurements of targets and countermeasures. In addition to the discussion of measurement techniques, a top-level qualitative summary of modeling approaches will be presented. No quantitative results or data will be presented.

Paper Details

Date Published: 21 October 2016
PDF: 13 pages
Proc. SPIE 9989, Technologies for Optical Countermeasures XIII, 99890P (21 October 2016); doi: 10.1117/12.2245174
Show Author Affiliations
Robert Gignilliat, U.S. Naval Research Lab. (United States)
Kathleen Tepfer, U.S. Naval Research Lab. (United States)
Rebekah F. Wilson, Applied Technology, Inc. (United States)
Thomas M. Taczak, Applied Technology, Inc. (United States)

Published in SPIE Proceedings Vol. 9989:
Technologies for Optical Countermeasures XIII
David H. Titterton; Robert J. Grasso; Mark A. Richardson, Editor(s)

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