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Proceedings Paper

A filter design method for beam hardening correction in middle-energy x-ray computed tomography
Author(s): Siyu Chen; Xiaoqi Xi; Lei Li; Leifei Luo; Yu Han; Jingyu Wang; Bin Yan
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Paper Abstract

Beam hardening artifact is common in X-ray computed tomography (X-CT). Using the metal sheet as a filter to preferentially attenuate low-energy photons is a simple and effective way for beam hardening artifact correction. However, generally it requires a large quantity of experiments to compare the filter material and thickness, which is lack of guidance of theory. In this paper, a novel filter design method for beam hardening correction, especially for middle energy X-CT, is presented. First, the spectrum of X-ray source under a certain tube voltage is estimated by Monte Carlo (MC) simulation or other simulation methods. Next, according to the X-ray mass attenuation coefficients of the object material, the energy range to be retained can be roughly determined in which the attenuation coefficients change slowly. Then, the spectra filtering performance with different filter materials and thicknesses can be calculated using the X-ray mass attenuation coefficients of each filter material and the simulated primitive spectrum. After that, the mean energy ratio (MER) of post-filter mean energy to pre-filter mean energy is obtained. Finally, based on the spectrum filtering performance and MER of the metal material, a suitable filter strategy is easily selected. Experimental results show that, the proposed method is simple and effective on beam hardening correction as well as increasing the image quality.

Paper Details

Date Published: 29 August 2016
PDF: 6 pages
Proc. SPIE 10033, Eighth International Conference on Digital Image Processing (ICDIP 2016), 1003352 (29 August 2016); doi: 10.1117/12.2245152
Show Author Affiliations
Siyu Chen, National Digital Switching System Engineering and Technological Research Ctr. (China)
Shenzhen Institutes of Advanced Technology (China)
Xiaoqi Xi, National Digital Switching System Engineering and Technological Research Ctr. (China)
Lei Li, National Digital Switching System Engineering and Technological Research Ctr. (China)
Leifei Luo, National Digital Switching System Engineering and Technological Research Ctr. (China)
Yu Han, National Digital Switching System Engineering and Technological Research Ctr. (China)
Jingyu Wang, National Digital Switching System Engineering and Technological Research Ctr. (China)
Bin Yan, National Digital Switching System Engineering and Technological Research Ctr. (China)


Published in SPIE Proceedings Vol. 10033:
Eighth International Conference on Digital Image Processing (ICDIP 2016)
Charles M. Falco; Xudong Jiang, Editor(s)

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