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Proceedings Paper

TDDA technology for high spatial resolution SWIR InGaAs imaging
Author(s): Jianxin Jia; Yueming Wang; Xiaoqiong Zhuang; Yi Yao; Shengwei Wang; Ding Zhao; Rong Shu; Jianyu Wang
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Paper Abstract

With the development of remote sensing technology, shortwave infrared (SWIR) imaging technology has got more and more attention because of its ability through the fog and high spatial resolution. High spatial resolution SWIR imaging often requires high frame frequency. If the frame frequency is too high, it could cause the shortage of the image’s signal to noise ratio (SNR), seriously affecting image quality. In order to solve the contradiction between high spatial resolution and sensitivity, time delay and digital accumulation (TDDA) technology is proposed in this paper to improve system’s SNR and image quality. A prototype of SWIR imaging system based on a large format area InGaAs detector is designed, which demonstrates TDDA technology. The experiment results indicate that TDDA technology can increase system’s SNR of the square root of accumulative stage and improve image’s uniformity. The results in this paper are helpful for the improvement and application of high spatial resolution SWIR imaging technology.

Paper Details

Date Published: 3 November 2016
PDF: 7 pages
Proc. SPIE 10030, Infrared, Millimeter-Wave, and Terahertz Technologies IV, 1003012 (3 November 2016); doi: 10.1117/12.2245127
Show Author Affiliations
Jianxin Jia, Shanghai Institute of Technical Physics (China)
Univ. of Chinese Academy of Sciences (China)
Yueming Wang, Shanghai Institute of Technical Physics (China)
Xiaoqiong Zhuang, Shanghai Institute of Technical Physics (China)
Yi Yao, Shanghai Institute of Technical Physics (China)
Shengwei Wang, Shanghai Institute of Technical Physics (China)
Ding Zhao, Shanghai Institute of Technical Physics (China)
Rong Shu, Shanghai Institute of Technical Physics (China)
Jianyu Wang, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 10030:
Infrared, Millimeter-Wave, and Terahertz Technologies IV
Cunlin Zhang; Xi-Cheng Zhang; Masahiko Tani, Editor(s)

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