Share Email Print
cover

Proceedings Paper

Laser induced damage threshold of optical fibers under ns pulses
Author(s): Jan Vanda; Mihai-George Muresan; Vojtech Bilek; Matej Sebek; Martin Hanus; Antonio Lucianetti; Daniela Rostohar; Tomas Mocek
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Fused silica based optical fibers are broadly used for beam delivery in laser technology, mostly for continuous lasers. However, powerful pulsed beams are still very challenging for optical fiber technology; in particular in the field of pulsed lasers providing ns-length pulses or shorter at high repetition rate. According to the current knowledge, laser induced damage threshold (LIDT) of optical fiber surfaces does not achieve values generally represented for properly treated fused silica. Therefore, broader testing and understanding of optical fibers surface laser induced damage threshold and influencing factors is a key in utilization of optical fibers in pulsed lasers.

Paper Details

Date Published: 6 December 2016
PDF: 9 pages
Proc. SPIE 10014, Laser-Induced Damage in Optical Materials 2016, 100140T (6 December 2016); doi: 10.1117/12.2245040
Show Author Affiliations
Jan Vanda, Institute of Physics of the ASCR, v.v.i. (Czech Republic)
Mihai-George Muresan, Institute of Physics of the ASCR, v.v.i. (Czech Republic)
Vojtech Bilek, Institute of Physics of the ASCR, v.v.i. (Czech Republic)
Czech Technical Univ. in Prague (Czech Republic)
Matej Sebek, Institute of Physics of the ASCR, v.v.i. (Czech Republic)
Czech Technical Univ. in Prague (Czech Republic)
Martin Hanus, Institute of Physics of the ASCR, v.v.i. (Czech Republic)
Antonio Lucianetti, Institute of Physics of the ASCR, v.v.i. (Czech Republic)
Daniela Rostohar, Institute of Physics of the ASCR, v.v.i. (Czech Republic)
Tomas Mocek, Institute of Physics of the ASCR, v.v.i. (Czech Republic)


Published in SPIE Proceedings Vol. 10014:
Laser-Induced Damage in Optical Materials 2016
Greg J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau, Editor(s)

© SPIE. Terms of Use
Back to Top