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Proceedings Paper

Research on method and device of non-disperse atomic fluorescence excitation light source impurity detection
Author(s): Yaqing Jia; Hong Wu; Zhengsheng Shen
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Paper Abstract

Analysis on the impurities of non-dispersive atomic fluorescence exciting light source is given. A method is proposed to detect this kind of light source impurity by using spectral analysis, and a set of light source detection standard device was accomplished. Corresponding algorithm and application software were developed. The detection wavelength range of the device is 190~350 nm, the maximum allowable error is ±0.3 nm. The device achieved fast detection of the excitation light source impurity and could be verified by the experimental results.

Paper Details

Date Published: 19 October 2016
PDF: 10 pages
Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101550W (19 October 2016); doi: 10.1117/12.2245022
Show Author Affiliations
Yaqing Jia, Beijing Institute of Metrology (China)
Hong Wu, Beijing Institute of Metrology (China)
Zhengsheng Shen, Beijing Institute of Metrology (China)


Published in SPIE Proceedings Vol. 10155:
Optical Measurement Technology and Instrumentation
Sen Han; JiuBin Tan, Editor(s)

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