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Proceedings Paper

Nanosecond laser-induced damage of transparent conducting ITO film at 1064nm
Author(s): Jae-Hyuck Yoo; John J. Adams; Marlon G. Menor; Tammy Y. Olson; Jonathan R. I. Lee; Amit Samanta; Jeff Bude; Selim Elhadj
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Paper Abstract

Transparent conducting films with superior laser damage performance have drawn intense interests toward optoelectronic applications under high energy density environment. In order to make optoelectronic applications with high laser damage performance, a fundamental understanding of damage mechanisms of conducting films is crucial. In this study, we performed laser damage experiments on tin-doped indium oxide films (ITO, Bandgap = 4.0 eV) using a nanosecond (ns) pulse laser (1064 nm) and investigated the underlying physical damage mechanisms. Single ns laser pulse irradiation on ITO films resulted in common thermal degradation features such as melting and evaporation although the laser photon energy (1.03 eV, 1064 nm) was smaller than the bandgap. Dominant laser energy absorption of the ITO film is attributed to free carriers due to degenerate doping. Upon multi-pulse irradiation on the film, damage initiation and growth were observed at lower laser influences, where no apparent damage was formed upon single pulse, suggesting a laser-induced incubation effect.

Paper Details

Date Published: 6 December 2016
PDF: 6 pages
Proc. SPIE 10014, Laser-Induced Damage in Optical Materials 2016, 100140H (6 December 2016); doi: 10.1117/12.2244977
Show Author Affiliations
Jae-Hyuck Yoo, Lawrence Livermore National Lab. (United States)
John J. Adams, Lawrence Livermore National Lab. (United States)
Marlon G. Menor, Lawrence Livermore National Lab. (United States)
Tammy Y. Olson, Lawrence Livermore National Lab. (United States)
Jonathan R. I. Lee, Lawrence Livermore National Lab. (United States)
Amit Samanta, Lawrence Livermore National Lab. (United States)
Jeff Bude, Lawrence Livermore National Lab. (United States)
Selim Elhadj, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 10014:
Laser-Induced Damage in Optical Materials 2016
Greg J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau, Editor(s)

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