
Proceedings Paper
Research for diagnosing electronic control fault of astronomical telescope’s armature winding by step signalFormat | Member Price | Non-Member Price |
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Paper Abstract
This paper puts forward a electronic fault diagnose method focusing on large-diameter astronomical telescope’s armature winding, and ascertains if it is the resistance or inductance which is out of order. When it comes to armature winding’s electronic fault, give the angular position a step signal, and compare the outputs of five models of normal, larger-resistance, smaller-resistance, larger-inductance and smaller-inductance, so we can position the fault. Firstly, we ascertain the transfer function of the angular position to the armature voltage, to analysis the output of armature voltage when the angular position’s input is step signal. Secondly, ascertain the different armature currents’ characteristics after armature voltage pass through different armature models. Finally, basing on the characteristics, we design two strategies of resistance and inductance separately. The author use MATLAB/Simulink function to model and emulate with the hardware parameters of the 2.5m-caliber telescope, which China and France developed cooperatively for Russia. Meanwhile, the author add a white noise disturbance to the armature voltage, the result shows its feasibility under a certain sized disturbance.
Paper Details
Date Published: 24 October 2016
PDF: 8 pages
Proc. SPIE 9682, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 968219 (24 October 2016); doi: 10.1117/12.2244942
Published in SPIE Proceedings Vol. 9682:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes
Myung K. Cho; Bin Fan, Editor(s)
PDF: 8 pages
Proc. SPIE 9682, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 968219 (24 October 2016); doi: 10.1117/12.2244942
Show Author Affiliations
Yulong Zhang, Nanjing Institute of Astronomical Optics and Technology (China)
Key Lab. of Astronomical Optics and Technology (China)
Univ. of Chinese Academy of Sciences (China)
Shihai Yang, Nanjing Institute of Astronomical Optics and Technology (China)
Key Lab. of Astronomical Optics and Technology (China)
Univ. of Chinese Academy of Sciences (China)
Key Lab. of Astronomical Optics and Technology (China)
Univ. of Chinese Academy of Sciences (China)
Shihai Yang, Nanjing Institute of Astronomical Optics and Technology (China)
Key Lab. of Astronomical Optics and Technology (China)
Univ. of Chinese Academy of Sciences (China)
Bozhong Gu, Nanjing Institute of Astronomical Optics and Technology (China)
Key Lab. of Astronomical Optics and Technology (China)
Univ. of Chinese Academy of Sciences (China)
Key Lab. of Astronomical Optics and Technology (China)
Univ. of Chinese Academy of Sciences (China)
Published in SPIE Proceedings Vol. 9682:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes
Myung K. Cho; Bin Fan, Editor(s)
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