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Proceedings Paper

A focal plane metrology system and PSF centroiding experiment
Author(s): Haitao Li; Baoquan Li; Yang Cao; Ligang Li
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Paper Abstract

In this paper, we present an overview of a detector array equipment metrology testbed and a micro-pixel centroiding experiment currently under development at the National Space Science Center, Chinese Academy of Sciences. We discuss on-going development efforts aimed at calibrating the intra-/inter-pixel quantum efficiency and pixel positions for scientific grade CMOS detector, and review significant progress in achieving higher precision differential centroiding for pseudo star images in large area back-illuminated CMOS detector. Without calibration of pixel positions and intrapixel response, we have demonstrated that the standard deviation of differential centroiding is below 2.0e-3 pixels.

Paper Details

Date Published: 19 October 2016
PDF: 4 pages
Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101550S (19 October 2016); doi: 10.1117/12.2244938
Show Author Affiliations
Haitao Li, National Space Science Ctr. (China)
Key Lab. of Electronics and Information Technology for Space Systems (China)
Key Lab. of Planetary Sciences (China)
Baoquan Li, National Space Science Ctr. (China)
Key Lab. of Electronics and Information Technology for Space Systems (China)
Yang Cao, National Space Science Ctr. (China)
Key Lab. of Electronics and Information Technology for Space Systems (China)
Ligang Li, Shanghai Astronomical Observatory (China)
Key Lab. of Planetary Sciences (China)


Published in SPIE Proceedings Vol. 10155:
Optical Measurement Technology and Instrumentation
Sen Han; JiuBin Tan, Editor(s)

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