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Proceedings Paper

Dual frequency comb metrology with one fiber laser
Author(s): Xin Zhao; Yasui Takeshi; Zheng Zheng
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Paper Abstract

Optical metrology techniques based on dual optical frequency combs have emerged as a hotly studied area targeting a wide range of applications from optical spectroscopy to microwave and terahertz frequency measurement. Generating two sets of high-quality comb lines with slightly different comb-tooth spacings with high mutual coherence and stability is the key to most of the dual-comb schemes. The complexity and costs of such laser sources and the associated control systems to lock the two frequency combs hinder the wider adoption of such techniques. Here we demonstrate a very simple and rather different approach to tackle such a challenge. By employing novel laser cavity designs in a mode-locked fiber laser, a simple fiber laser setup could emit dual-comb pulse output with high stability and good coherence between the pulse trains. Based on such lasers, comb-tooth-resolved dual-comb optical spectroscopy is demonstrated. Picometer spectral resolving capability could be realized with a fiber-optic setup and a low-cost data acquisition system and standard algorithms. Besides, the frequency of microwave signals over a large range can be determined based on a simple setup. Our results show the capability of such single-fiber-laser-based dual-comb scheme to reduce the complexity and cost of dual-comb systems with excellent quality for different dual-comb applications.

Paper Details

Date Published: 4 November 2016
PDF: 6 pages
Proc. SPIE 10026, Real-time Photonic Measurements, Data Management, and Processing II, 100260G (4 November 2016); doi: 10.1117/12.2244023
Show Author Affiliations
Xin Zhao, BeiHang Univ. (China)
Yasui Takeshi, Tokushima Univ. (Japan)
JST, ERATO (Japan)
Zheng Zheng, BeiHang Univ. (China)
Collaborative Innovation Ctr. of Geospatial Technology (China)


Published in SPIE Proceedings Vol. 10026:
Real-time Photonic Measurements, Data Management, and Processing II
Ming Li; Bahram Jalali; Keisuke Goda; Kevin K. Tsia, Editor(s)

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