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Proceedings Paper

Design of efficient and simple interface testing equipment for opto-electric tracking system
Author(s): Qiong Liu; Chao Deng; Jing Tian; Yao Mao
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Paper Abstract

Interface testing for opto-electric tracking system is one important work to assure system running performance, aiming to verify the design result of every electronic interface matching the communication protocols or not, by different levels. Opto-electric tracking system nowadays is more complicated, composed of many functional units. Usually, interface testing is executed between units manufactured completely, highly depending on unit design and manufacture progress as well as relative people. As a result, it always takes days or weeks, inefficiently. To solve the problem, this paper promotes an efficient and simple interface testing equipment for opto-electric tracking system, consisting of optional interface circuit card, processor and test program. The hardware cards provide matched hardware interface(s), easily offered from hardware engineer. Automatic code generation technique is imported, providing adaption to new communication protocols. Automatic acquiring items, automatic constructing code architecture and automatic encoding are used to form a new program quickly with adaption. After simple steps, a standard customized new interface testing equipment with matching test program and interface(s) is ready for a waiting-test system in minutes. The efficient and simple interface testing equipment for opto-electric tracking system has worked for many opto-electric tracking system to test entire or part interfaces, reducing test time from days to hours, greatly improving test efficiency, with high software quality and stability, without manual coding. Used as a common tool, the efficient and simple interface testing equipment for opto-electric tracking system promoted by this paper has changed traditional interface testing method and created much higher efficiency.

Paper Details

Date Published: 24 October 2016
PDF: 6 pages
Proc. SPIE 9682, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 968212 (24 October 2016); doi: 10.1117/12.2243951
Show Author Affiliations
Qiong Liu, Institute of Optics and Electronics (China)
Key Lab. of Optical Engineering (China)
Chao Deng, Institute of Optics and Electronics (China)
Key Lab. of Optical Engineering (China)
Univ. of Chinese Academy of Sciences (China)
Jing Tian, Institute of Optics and Electronics (China)
Key Lab. of Optical Engineering (China)
Yao Mao, Institute of Optics and Electronics (China)
Key Lab. of Optical Engineering (China)


Published in SPIE Proceedings Vol. 9682:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes
Myung K. Cho; Bin Fan, Editor(s)

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