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Proceedings Paper

Study on CCD detector irradiated by multi-pulse laser
Author(s): Mingxin Li; Guangyong Jin; Yong Tan
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Paper Abstract

Using millisecond pulse laser irradiating CCD detector, the interacting process between millisecond pulse laser and CCD detector was studied, the forming reason of different damage effects was analyzed, the damage process and damage laws of CCD detector under millisecond pulse laser were revealed. The results show that: with the same laser energy density, the maximum temperature and the damaged area increased with the increase of pulse number; with the same pulse number, the range of the noise widened with the increase of laser energy density, and the vertical shift register impedance values decreased with the increase of laser energy density; the microlens layer on the damaged edge of CCD detector occurred stress damage.

Paper Details

Date Published: 19 October 2016
PDF: 5 pages
Proc. SPIE 10152, High Power Lasers, High Energy Lasers, and Silicon-based Photonic Integration, 1015207 (19 October 2016); doi: 10.1117/12.2243823
Show Author Affiliations
Mingxin Li, Changchun Univ. of Science and Technology (China)
Guangyong Jin, Changchun Univ. of Science and Technology (China)
Yong Tan, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 10152:
High Power Lasers, High Energy Lasers, and Silicon-based Photonic Integration
Lijun Wang; Zhiping Zhou, Editor(s)

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