Share Email Print
cover

Proceedings Paper

The method to reduce the spinal error in the aspheric mirror testing with the CGH
Author(s): Fengtao Yan; Bin Fan; Xi Hou; Fan Wu; Baiping Lei; Haitao Liu; Hongshen Zhao
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Interferometric optical testing using computer-generated holograms(CGHs) has proven to supply a very good and accurate measurements method of the aspheric surfaces. However, the CGHs are diffractive optical elements which use diffraction to create wavefronts of light with desired amplitudes and phases. The different diffraction order of the light would be make some ghost image to the fringe pattern. It would introduce some spinal error to the measurement results. This error would not be avoided after the CGH designed and manufactured. In this work, we take two measurement steps to reduce the spinal error. The first step, the apheric mirror was tested with the CGHs. The second step, the aspheric mirror was tested with transmission sphere directly. Then the subaperture theory was used to obtain the final measurement results of the aspheric mirror surface. The experimental demonstrations were provided by testing an aspheric mirror. The results are shown that this method could reduce the spinal error.

Paper Details

Date Published: 27 September 2016
PDF: 5 pages
Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 968424 (27 September 2016); doi: 10.1117/12.2243805
Show Author Affiliations
Fengtao Yan, Institute of Optics and Electronics (China)
Bin Fan, Institute of Optics and Electronics (China)
Xi Hou, Institute of Optics and Electronics (China)
Fan Wu, Institute of Optics and Electronics (China)
Baiping Lei, Institute of Optics and Electronics (China)
Haitao Liu, Institute of Optics and Electronics (China)
Hongshen Zhao, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 9684:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Yudong Zhang; Fan Wu; Ming Xu; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top