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Proceedings Paper

Software system design for the non-null digital Moiré interferometer
Author(s): Meng Chen; Qun Hao; Yao Hu; Shaopu Wang; Tengfei Li; Lin Li
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Paper Abstract

Aspheric optical components are an indispensable part of modern optics systems. With the development of aspheric optical elements fabrication technique, high-precision figure error test method of aspheric surfaces is a quite urgent issue now. We proposed a digital Moiré interferometer technique (DMIT) based on partial compensation principle for aspheric and freeform surface measurement. Different from traditional interferometer, DMIT consists of a real and a virtual interferometer. The virtual interferometer is simulated with Zemax software to perform phase-shifting and alignment. We can get the results by a series of calculation with the real interferogram and virtual interferograms generated by computer. DMIT requires a specific, reliable software system to ensure its normal work. Image acquisition and data processing are two important parts in this system. And it is also a challenge to realize the connection between the real and virtual interferometer. In this paper, we present a software system design for DMIT with friendly user interface and robust data processing features, enabling us to acquire the figure error of the measured asphere. We choose Visual C++ as the software development platform and control the ideal interferometer by using hybrid programming with Zemax. After image acquisition and data transmission, the system calls image processing algorithms written with Matlab to calculate the figure error of the measured asphere. We test the software system experimentally. In the experiment, we realize the measurement of an aspheric surface and prove the feasibility of the software system.

Paper Details

Date Published: 13 November 2016
PDF: 8 pages
Proc. SPIE 10023, Optical Metrology and Inspection for Industrial Applications IV, 1002303 (13 November 2016); doi: 10.1117/12.2243790
Show Author Affiliations
Meng Chen, Beijing Institute of Technology (China)
Qun Hao, Beijing Institute of Technology (China)
Yao Hu, Beijing Institute of Technology (China)
Shaopu Wang, Beijing Institute of Technology (China)
Tengfei Li, Beijing Institute of Technology (China)
Lin Li, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 10023:
Optical Metrology and Inspection for Industrial Applications IV
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

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