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Proceedings Paper

Analysis of stray radiation for infrared optical system
Author(s): Yang Li; Tingcheng Zhang; Zhibo Liao; Shengbo Mu; Jianxiang Du; Xiangdong Wang
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Paper Abstract

Based on the theory of radiation energy transfer in the infrared optical system, two methods for stray radiation analysis caused by interior thermal radiation in infrared optical system are proposed, one of which is important sampling method technique using forward ray trace, another of which is integral computation method using reverse ray trace. The two methods are discussed in detail. A concrete infrared optical system is provided. Light-tools is used to simulate the passage of radiation from the mirrors and mounts. Absolute values of internal irradiance on the detector are received. The results shows that the main part of the energy on the detector is due to the critical objects which were consistent with critical objects obtained by reverse ray trace, where mirror self-emission contribution is about 87.5% of the total energy. Corresponding to the results, the irradiance on the detector calculated by the two methods are in good agreement. So the validity and rationality of the two methods are proved.

Paper Details

Date Published: 19 October 2016
PDF: 6 pages
Proc. SPIE 10154, Advanced Optical Design and Manufacturing Technology and Astronomical Telescopes and Instrumentation, 1015404 (19 October 2016); doi: 10.1117/12.2243752
Show Author Affiliations
Yang Li, Beijing Institute of Space Mechanics and Electricity (China)
Tingcheng Zhang, Beijing Institute of Space Mechanics and Electricity (China)
Zhibo Liao, Beijing Institute of Space Mechanics and Electricity (China)
Shengbo Mu, Beijing Institute of Space Mechanics and Electricity (China)
Jianxiang Du, Beijing Institute of Space Mechanics and Electricity (China)
Xiangdong Wang, Beijing Institute of Space Mechanics and Electricity (China)


Published in SPIE Proceedings Vol. 10154:
Advanced Optical Design and Manufacturing Technology and Astronomical Telescopes and Instrumentation
Min Xu; Ji Yang, Editor(s)

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