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Proceedings Paper

Research overview on reliability of infrared focal plane array detector assemblies
Author(s): Meng Chao; Wang Yang; Peng Jing
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Paper Abstract

Infrared Detector Dewar Cooler Assembly (IDDCA) is the key component of infrared system, and the reliability of IDDCA determines the reliability of the system and affects the application of the system to a great extent. Reliability research is of great significance for the engineering application of IDDCA. In this paper, research progress of reliability model, failure modes, acceleration factors, and reliability tests on the assemblies are introduced. Optimizing process and life cycle cost during the manufacturing, and evaluating reliability relying on database are described. In addition, the main thought of reliability research on the assemblies is briefly analyzed. This provides a reference for the domestic reliability research of the assemblies.

Paper Details

Date Published: 25 October 2016
PDF: 8 pages
Proc. SPIE 10157, Infrared Technology and Applications, and Robot Sensing and Advanced Control, 1015702 (25 October 2016); doi: 10.1117/12.2243743
Show Author Affiliations
Meng Chao, Luoyang Optoelectro Technology Development Ctr. (China)
Wang Yang, Luoyang Optoelectro Technology Development Ctr. (China)
Peng Jing, Luoyang Optoelectro Technology Development Ctr. (China)


Published in SPIE Proceedings Vol. 10157:
Infrared Technology and Applications, and Robot Sensing and Advanced Control

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