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Proceedings Paper

New machining and testing method of large angle infrared wedge mirror parts
Author(s): Ying Su; Rui Guo; Fumei Zhang; Zheng Zhang; Xuanmin Liu; Xu Zengqi; Wenting Li; Feng Zhang
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Paper Abstract

Large angle wedge parts were widely used in the optical system that was used for achieving a wide range of scanning. Due to the parts having the characteristic of large difference in the thickness of both ends and high density, the accuracy of the wedge angle was hard to ensure to reach second level in optical processing. Generally, wedge mirror angle was measured by contact comparison method which was easy to damage the surface. In view of the existence of two practical problems, in this paper, based on theoretical analysis, by taking three key measures that were the accurate positioning for the central position of the large angle wedge part, the accuracy control of angle precision machined of wedge mirror and fast and non destructive laser assisted absolute measurement of large angle wedge, the qualified rate of parts were increased to 100%, a feasible, controllable and efficient process route for large angle infrared wedge parts was found out.

Paper Details

Date Published: 28 October 2016
PDF: 6 pages
Proc. SPIE 9683, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 96831M (28 October 2016); doi: 10.1117/12.2243645
Show Author Affiliations
Ying Su, Xi'an Institute of Applied Optics (China)
Rui Guo, Xi'an Institute of Applied Optics (China)
Fumei Zhang, Xi'an Institute of Applied Optics (China)
Zheng Zhang, Xi'an Institute of Applied Optics (China)
Xuanmin Liu, Xi'an Institute of Applied Optics (China)
Xu Zengqi, Xi'an Institute of Applied Optics (China)
Wenting Li, Xi'an Institute of Applied Optics (China)
Feng Zhang, Xi'an Institute of Applied Optics (China)


Published in SPIE Proceedings Vol. 9683:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Wenhan Jiang; Li Yang; Oltmann Riemer; Shengyi Li; Yongjian Wan, Editor(s)

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