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Proceedings Paper

Analysis and modeling of atmospheric turbulence on the high-resolution space optical systems
Author(s): Jiang Lili; Xiaomei Chen; Guoqiang Ni
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Paper Abstract

Modeling and simulation of optical remote sensing system plays an unslightable role in remote sensing mission predictions, imaging system design, image quality assessment. It has already become a hot research topic at home and abroad. Atmospheric turbulence influence on optical systems is attached more and more importance to as technologies of remote sensing are developed. In order to study the influence of atmospheric turbulence on earth observation system, the atmospheric structure parameter was calculated by using the weak atmospheric turbulence model; and the relationship of the atmospheric coherence length and high resolution remote sensing optical system was established; then the influence of atmospheric turbulence on the coefficient r0h of optical remote sensing system of ground resolution was derived; finally different orbit height of high resolution optical system imaging quality affected by atmospheric turbulence was analyzed. Results show that the influence of atmospheric turbulence on the high resolution remote sensing optical system, the resolution of which has reached sub meter level meter or even the 0.5m, 0.35m and even 0.15m ultra in recent years, image quality will be quite serious. In the above situation, the influence of the atmospheric turbulence must be corrected. Simulation algorithms of PSF are presented based on the above results. Experiment and analytical results are posted.

Paper Details

Date Published: 27 September 2016
PDF: 7 pages
Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96841S (27 September 2016); doi: 10.1117/12.2243593
Show Author Affiliations
Jiang Lili, Beijing Institute of Technology (China)
Key Lab. of Photoelectronic Imaging Technology and System (China)
Xiaomei Chen, Beijing Institute of Technology (China)
Key Lab. of Photoelectronic Imaging Technology and System (China)
Guoqiang Ni, Beijing Institute of Technology (China)
Key Lab. of Photoelectronic Imaging Technology and System (China)


Published in SPIE Proceedings Vol. 9684:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Yudong Zhang; Fan Wu; Ming Xu; Sandy To, Editor(s)

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