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Proceedings Paper

Experimental study of HgCdTe imaging sensor irradiated by pulse CO2 laser
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Paper Abstract

The damages of TEA-CO2 laser to HgCdTe imaging sensor are researched experimentally and theoretically. The shadows, cracks and dark line are observed. There is a gap between photosensitive layer and CdZnTe which decreases light transmittance, so that the shadows occur. It shows that the crack damages begin from photosensitive layer. The sensor is irradiated by pulse laser, the absorptivity of photosensitive layer is strong, sharp temperatures fluctuations inside the sensor, leading to stress. With the stress increased, the cracks are observed on the surface of the detector. Cracked the surface of the substrate, and effective transmission reduced, which caused gray pixel response decline. The dark line in image occurs several times because Hg atoms separate out from the detector and gather together at the Si-COMS which makes a short circuit between silicon substrate and signal choice line. The volatility of Hg makes the short circuit is unstable, resulting in the dark line repeated in the output image, but the short circuit occurs by chance.

Paper Details

Date Published: 19 October 2016
PDF: 6 pages
Proc. SPIE 10152, High Power Lasers, High Energy Lasers, and Silicon-based Photonic Integration, 1015202 (19 October 2016); doi: 10.1117/12.2243576
Show Author Affiliations
Xi Wang, Electronic Engineering Institute (China)
Qingsheng Wang, Anhui Institute of Optics and Fine Mechanics (China)
Hongtao Hu, Anhui Institute of Optics and Fine Mechanics (China)
Xiaodong Fang, Anhui Institute of Optics and Fine Mechanics (China)
Jinsong Nie, Electronic Engineering Institute (China)


Published in SPIE Proceedings Vol. 10152:
High Power Lasers, High Energy Lasers, and Silicon-based Photonic Integration
Lijun Wang; Zhiping Zhou, Editor(s)

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