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Proceedings Paper

A new processing technology and detection method for isosceles prism
Author(s): Rui Guo; Ying Su; Chaoping Chen; Yunlong Zhang; Wenting Li; Feng Zhang; Zengqi Xu; Xuanmin Liu
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Paper Abstract

The optical parallelism is an important indicators of isosceles prism. However, it cannot be directly measured in the processing process, and it is measured when the small surface is coated with silver film, which results in low processing rate. By analyzing the principles of the first optical parallelism and the second optical parallelism, this paper provides a new processing and detection method for isosceles prism. The good verticality between the three working face for isosceles prism and a side face can ensure the second optical parallelism. The small difference of 67.5°can ensure the first optical parallelism. By changing the position of the incident light when testing, the number of reflections can be reduced from seven to three. The reflection principle deduces the formula: θII(7)=2.4θII(3),which to improve the machining accuracy and avoid the surface imperfections in detection. By using this process, precision and productivity can be effectively improved, the complexity of the process is reduced, and the qualification of isosceles prism has been improved.

Paper Details

Date Published: 28 October 2016
PDF: 5 pages
Proc. SPIE 9683, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 96831N (28 October 2016); doi: 10.1117/12.2243457
Show Author Affiliations
Rui Guo, Xi'an Institute of Applied Optics (China)
Ying Su, Xi'an Institute of Applied Optics (China)
Chaoping Chen, Xi'an Institute of Applied Optics (China)
Yunlong Zhang, Xi'an Institute of Applied Optics (China)
Wenting Li, Xi'an Institute of Applied Optics (China)
Feng Zhang, Xi'an Institute of Applied Optics (China)
Zengqi Xu, Xi'an Institute of Applied Optics (China)
Xuanmin Liu, Xi'an Institute of Applied Optics (China)


Published in SPIE Proceedings Vol. 9683:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Wenhan Jiang; Li Yang; Oltmann Riemer; Shengyi Li; Yongjian Wan, Editor(s)

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