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Proceedings Paper

Test technology on CCD anti-sunlight jamming based on complex circumstance
Author(s): Sheng-bing Shi; Zhen-xing Chen; Fu-li Han
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Paper Abstract

Visible-light reconnaissance device based on CCD is applied to all kinds of weapons, CCD cannot work because of saturation when it faces intense light. Sun is intense light source in nature and assignably influences CCD performance. In this paper, aim is appraising CCD anti-sunlight ability, object reflection characteristic test system is designed, based on typical background reflection characteristic including grant, sand and so on, complex circumstance is formulated and test project is optimized with orthogonal design method, problem that is without test technology on CCD anti-sunlight jamming is solved.

Paper Details

Date Published: 27 September 2016
PDF: 6 pages
Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 968410 (27 September 2016); doi: 10.1117/12.2243445
Show Author Affiliations
Sheng-bing Shi, Bai Cheng Ordnance Test Ctr. (China)
Zhen-xing Chen, Bai Cheng Ordnance Test Ctr. (China)
Fu-li Han, Bai Cheng Ordnance Test Ctr. (China)


Published in SPIE Proceedings Vol. 9684:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Yudong Zhang; Fan Wu; Ming Xu; Sandy To, Editor(s)

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