Share Email Print
cover

Proceedings Paper

Design of a photoelectron/ion imaging spectrometer with high temporal resolution
Author(s): Yuzhu Liu; Yue Guan; Kuang Ao; Shixin Pei; Fang Gu; Jing Su; Linhua Xu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A conventional VMI (velocity map imaging)-TOF (time-of-flight) spectrometer is modified by adding an extra electrode. By this small modification, the longitudinal focus can be realized for TOF mass resolution while maintaining the lateral focus for optimal VMI energy resolution simultaneously. The mass-resolving power by four-electrode ion optics is greatly enhanced. Our design is especially useful in experiment with a non-focused laser beam.

Paper Details

Date Published: 27 September 2016
PDF: 5 pages
Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96840A (27 September 2016); doi: 10.1117/12.2243431
Show Author Affiliations
Yuzhu Liu, Nanjing Univ. of Information Science and Technology (China)
Jiangsu Collaborative Innovation Ctr. on Atmospheric Environment and Equipment Technology (China)
Yue Guan, Nanjing Univ. of Information Science and Technology (China)
Jiangsu Collaborative Innovation Ctr. on Atmospheric Environment and Equipment Technology (China)
Kuang Ao, Nanjing Univ. of Information Science and Technology (China)
Shixin Pei, Nanjing Univ. of Information Science and Technology (China)
Fang Gu, Nanjing Univ. of Information Science and Technology (China)
Jing Su, Nanjing Univ. of Information Science and Technology (China)
Linhua Xu, Nanjing Univ. of Information Science and Technology (China)


Published in SPIE Proceedings Vol. 9684:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Yudong Zhang; Fan Wu; Ming Xu; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top