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Proceedings Paper

Performance test and image correction of CMOS image sensor in radiation environment
Author(s): Congzheng Wang; Song Hu; Chunming Gao; Chang Feng
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Paper Abstract

CMOS image sensors rival CCDs in domains that include strong radiation resistance as well as simple drive signals, so it is widely applied in the high-energy radiation environment, such as space optical imaging application and video monitoring of nuclear power equipment. However, the silicon material of CMOS image sensors has the ionizing dose effect in the high-energy rays, and then the indicators of image sensors, such as signal noise ratio (SNR), non-uniformity (NU) and bad point (BP) are degraded because of the radiation. The radiation environment of test experiments was generated by the 60Co γ-rays source. The camera module based on image sensor CMV2000 from CMOSIS Inc. was chosen as the research object. The ray dose used for the experiments was with a dose rate of 20krad/h. In the test experiences, the output signals of the pixels of image sensor were measured on the different total dose. The results of data analysis showed that with the accumulation of irradiation dose, SNR of image sensors decreased, NU of sensors was enhanced, and the number of BP increased. The indicators correction of image sensors was necessary, as it was the main factors to image quality. The image processing arithmetic was adopt to the data from the experiences in the work, which combined local threshold method with NU correction based on non-local means (NLM) method. The results from image processing showed that image correction can effectively inhibit the BP, improve the SNR, and reduce the NU.

Paper Details

Date Published: 27 September 2016
PDF: 8 pages
Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96841H (27 September 2016); doi: 10.1117/12.2243427
Show Author Affiliations
Congzheng Wang, Institute of Optics and Electronics (China)
Univ. of Electronic Science and Technology of China (China)
Univ. of Chinese Academy of Sciences (China)
Song Hu, Institute of Optics and Electronics (China)
Chunming Gao, Univ. of Electronic Science and Technology of China (China)
Chang Feng, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 9684:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Yudong Zhang; Fan Wu; Ming Xu; Sandy To, Editor(s)

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