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Proceedings Paper

Stray light measurement for point source transmittance of space optical systems
Author(s): Qinfang Chen; Zhen Ma; Xinyao Li; Zhihai Pang; Liang Xu; Zhaohui Li
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Paper Abstract

The increased sensitivity of space-based sensors has imposed greater stray light performance goals on telescope design. To meet the demand, a stray light test station for measuring point source transmission (PST) has been built with a lower threshold and higher accuracy. The station is nearly all black with dimensions of 28m long by 8m wide by 9m high. it is coupled with a double cylindrical chamber that reflects the specular light away from the instrument under test. The chamber is a Class 6 cleanroom. The station will allow measuring the instruments with up to a 1 meters diameter, and to perform these measurements at visible and infrared wavelengths. The instrument under test will allow to scan at azimuth angles ±110°, and at elevation ±15°. The tests were performed to estimate stray light characteristics of two optical instruments. Test results demonstrated PST performance below 1×10-7 at visible wavelengths, and 1×10-6 at infrared wavelengths.

Paper Details

Date Published: 27 September 2016
PDF: 7 pages
Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96842V (27 September 2016); doi: 10.1117/12.2243405
Show Author Affiliations
Qinfang Chen, Xi'an Institute of Optics and Precision Mechanics (China)
Zhen Ma, Xi'an Institute of Optics and Precision Mechanics (China)
Xinyao Li, Shanghai Institute of Technical Physics (China)
Zhihai Pang, Xi'an Institute of Optics and Precision Mechanics (China)
Liang Xu, Xi'an Institute of Optics and Precision Mechanics (China)
Zhaohui Li, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 9684:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Yudong Zhang; Fan Wu; Ming Xu; Sandy To, Editor(s)

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