Share Email Print
cover

Proceedings Paper

A standard test method based on point spread function for three-dimensional imaging system
Author(s): Tao Wen; Jinxin Dong; Zhixiong Hu; Zhenggang Cao; Wenli Liu; Jianlin Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Point spread function (PSF) theory has been demonstrated as proof of concept in evaluation of spatial resolution of three dimensional imaging technology like optical coherence tomography (OCT) and confocal microscopy. A robust test target and associated evaluation algorithm are in demand for keeping regular quality assurance and inter-comparison of such 3D imaging system performance. To achieve this goal, standard-size micro spheres were utilized to develop PSF phantoms. The OCT system was investigated with the microsphere PSF phantom. Differing from previous study, a statistical model comprising data from hundreds of scatterers was established to acquire the PSF distribution and variation. The research provided an effective method and a set of practical standard phantoms for evaluating resolution of three dimensional imaging modalities.

Paper Details

Date Published: 27 September 2016
PDF: 9 pages
Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96842F (27 September 2016); doi: 10.1117/12.2243260
Show Author Affiliations
Tao Wen, Beijing Univ. of Chemical Technology (China)
Jinxin Dong, Harbin Institute of Technology (China)
Zhixiong Hu, National Institute of Metrology (China)
Zhenggang Cao, Harbin Institute of Technology (China)
Wenli Liu, National Institute of Metrology (China)
Jianlin Wang, Beijing Univ. of Chemical Technology (China)


Published in SPIE Proceedings Vol. 9684:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Yudong Zhang; Fan Wu; Ming Xu; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top