Share Email Print
cover

Proceedings Paper

Axis consistency testing method based on image processing technology for non-cooperative target
Author(s): Xin Li; Yong Zhang; Dongxi Ma
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The multi-axis consistency among optical sensors is the basic guarantee to ensure the normal operation of the entire optical equipment. In the paper the new method which is image processing technology for non-cooperative target is provided to solve the axis consistency testing question. In detail, firstly an observing object is chosen as non-cooperative target in scene in front of inspected equipment. Secondly the target is observed by the optical sensor and the central location of crosshair in image is recorded. Thirdly the same target is observed again using another optical sensor and the central location of crosshair in image is record. At last, the testing result of two optical sensors can be obtained by the position deviation of crosshair central comparing two images. The axis consistency of mechanical axis and the optical axis is detected by the CCD imaging systems, which held on the mechanical axis of the measured object. Not only the proposed method is suitable to different working band, but also it is very small, not limited by field condition and convenient for carry. Furthermore experimental results show the proposed method has high inspecting accuracy, which explain the feasibility and potential applications.

Paper Details

Date Published: 27 September 2016
PDF: 6 pages
Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96842X (27 September 2016); doi: 10.1117/12.2243251
Show Author Affiliations
Xin Li, Shijiazhuang Mechanical Technology Institute (China)
Yong Zhang, Shijiazhuang Mechanical Technology Institute (China)
Dongxi Ma, Shijiazhuang Mechanical Technology Institute (China)


Published in SPIE Proceedings Vol. 9684:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Yudong Zhang; Fan Wu; Ming Xu; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top