Share Email Print
cover

Proceedings Paper

Universal system for the automation of test setups
Author(s): Alexandru Buturuga; Rodica Constantinescu; Dan Stoichescu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper presents the concept of a universal control system for automation of small test setups. The main purpose is to control the environment in which the electronic component is being tested. The system has two device types: a master device and multiple slave devices. In this control system the devices are able to communicate with each other and are able to monitor and control specific tasks or actions required in the test flow. The system can be configured using a computer application based on text input.

Paper Details

Date Published: 14 December 2016
PDF: 8 pages
Proc. SPIE 10010, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VIII, 100100W (14 December 2016); doi: 10.1117/12.2243244
Show Author Affiliations
Alexandru Buturuga, Univ. Politehnica of Bucharest (Romania)
Rodica Constantinescu, Univ. Politehnica of Bucharest (Romania)
Dan Stoichescu, Univ. Politehnica of Bucharest (Romania)


Published in SPIE Proceedings Vol. 10010:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VIII
Marian Vladescu; Cornel T. Panait; Razvan Tamas; George Caruntu; Ionica Cristea, Editor(s)

© SPIE. Terms of Use
Back to Top