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Proceedings Paper

Fresnel incoherent correlation holography and its imaging properties
Author(s): Zhipeng Wang; Haotong Ma; Ge Ren; Zongliang Xie; Huan Yu
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Paper Abstract

The incoherent digital holography makes it possible to record holograms under incoherent illumination, which lowers requirement for the coherence of light sources and results in expanding its application to white-light and fluorescence illuminating circumstances. The Fresnel Incoherent Correlation Holography (FINCH) technology achieves diverging the incident beam and shifting phase by mounting phase masks on the phase modulator. Then it obtains holograms with phase difference and reconstructs the image. In this paper, we explain the principles of the FINCH technology, and introduce the n-step phase-shifting method which is utilized to eliminate the twin image and bias term in holograms. During the research, we studied what impact the term n may have on imaging performance, compared imaging performances when different phase masks are mounted on SLM, and established simulation system on imaging with which imaging performances are deeply inspected. At last, it is shown in the research that the FINCH technology could record holograms of objects, from which clear images could be reconstructed digitally.

Paper Details

Date Published: 27 September 2016
PDF: 9 pages
Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96841J (27 September 2016); doi: 10.1117/12.2243137
Show Author Affiliations
Zhipeng Wang, Institute of Optics and Electronics (China)
Key Lab. of Optical Engineering (China)
Univ. of Chinese Academy of Sciences (China)
Haotong Ma, Institute of Optics and Electronics (China)
Key Lab. of Optical Engineering (China)
Ge Ren, Institute of Optics and Electronics (China)
Key Lab. of Optical Engineering (China)
Zongliang Xie, Institute of Optics and Electronics (China)
Key Lab. of Optical Engineering (China)
Univ. of Chinese Academy of Sciences (China)
Huan Yu, Institute of Optics and Electronics (China)
Key Lab. of Optical Engineering (China)
Univ. of Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 9684:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Yudong Zhang; Fan Wu; Ming Xu; Sandy To, Editor(s)

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