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Proceedings Paper

The technical consideration of multi-beam mask writer for production
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Paper Abstract

Multi-beam mask writer is under development to solve the throughput and patterning resolution problems in VSB mask writer. Theoretically, the writing time is appropriate for future design node and the resolution is improved with multi-beam mask writer. Many previous studies show the feasible results of resolution, CD control and registration. Although such technical results of development tool seem to be enough for mass production, there are still many unexpected problems for real mass production. In this report, the technical challenges of multi-beam mask writer are discussed in terms of production and application. The problems and issues are defined based on the performance of current development tool compared with the requirements of mask quality. Using the simulation and experiment, we analyze the specific characteristics of electron beam in multi-beam mask writer scheme. Consequently, we suggest necessary specifications for mass production with multi-beam mask writer in the future.

Paper Details

Date Published: 3 October 2016
PDF: 8 pages
Proc. SPIE 9985, Photomask Technology 2016, 998506 (3 October 2016); doi: 10.1117/12.2243129
Show Author Affiliations
Sang Hee Lee, SAMSUNG Electronics Co., Ltd. (Korea, Republic of)
Byung-Sup Ahn, SAMSUNG Electronics Co., Ltd. (Korea, Republic of)
Jin Choi, SAMSUNG Electronics Co., Ltd. (Korea, Republic of)
In Kyun Shin, SAMSUNG Electronics Co., Ltd. (Korea, Republic of)
Shuichi Tamamushi, SAMSUNG Electronics Co., Ltd. (Korea, Republic of)
Chan-Uk Jeon, SAMSUNG Electronics Co., Ltd. (Korea, Republic of)

Published in SPIE Proceedings Vol. 9985:
Photomask Technology 2016
Bryan S. Kasprowicz; Peter D. Buck, Editor(s)

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