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Proceedings Paper

Study of stresses in optical thin films by optical fiber technology
Author(s): Shouyao Sun; Jiu Lin Zhou; Xuequan Zan
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Paper Abstract

In-situ measuring the intensity and characteristics stresses in optical coatings during deposition can get a lot of important information for improving the properties of optical thin films, which is more important for some devices uesd in modern science and technology. This paper gives a new method which uses a kind of most in-fashion sensing technology, a single-mode optical fiber sensing system developed in the middle of 1900s to test the stresses in optical coatings during deposition with the aid of a single-chip micro-computer and a micro-printer. The experimental results show that this method takes advantages of high sensitivity wide dynamic range, small volume, available in-situ measurement and easily interfaced to any vacuum system.

Paper Details

Date Published: 1 December 1990
PDF: 4 pages
Proc. SPIE 1324, Modeling of Optical Thin Films II, (1 December 1990); doi: 10.1117/12.22430
Show Author Affiliations
Shouyao Sun, Univ. of Electronic Science and Technology of China (China)
Jiu Lin Zhou, Southwest Technical Physics Institute (China)
Xuequan Zan, Optoelectronic Technical Institute (China)


Published in SPIE Proceedings Vol. 1324:
Modeling of Optical Thin Films II
Michael Ray Jacobson, Editor(s)

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