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Proceedings Paper

Research on testing method for combined aspheric surface with non-rotational symmetric
Author(s): Wencai Zhou; Feng Xu; Xiaoxiao Wei
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Paper Abstract

Non-rotational symmetric aspheric surface has many significant advantages, but it still can not be widely used because the limiting that there is no method can tests it precisely. At present, the coordinate contour measuring machine is the main testing method for the aspheric surface with non-rotational symmetric, but the measurement accuracy of this method is not high. In this paper, the method of diffraction compensator (computed graphic holograph) has been adopted to test the combined aspheric surface, which can compensate the phase caused by tested lens. The sample surface is the combined aspheric surface with diameter of 33.84mm, and the process from optical software simulation design, the fabrication of the computed graphic holograph (CGH) to experimental platform built is given in detail after testing via the CGH technology. The simulation results show that the root mean square (RMS) of remnant wave-front error is 0.004 λ, and the peak to valley (PV) is 0.0245 λ. The free-from surface has been tested by Zygo interferometer, and the experimental results show that the RMS is 0.49 λ, the PV is 4.69 λ. The accuracy of the result is higher than that of coordinate contour measuring machine. The system error caused by optical elements analysed is 0.1149λ. The accurate result means that the CGH technology for testing the combined aspheric surface is realized.

Paper Details

Date Published: 27 September 2016
PDF: 6 pages
Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96842I (27 September 2016); doi: 10.1117/12.2242864
Show Author Affiliations
Wencai Zhou, Soochow Univ. (China)
Feng Xu, Soochow Univ. (China)
Xiaoxiao Wei, Soochow Univ. (China)


Published in SPIE Proceedings Vol. 9684:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Yudong Zhang; Fan Wu; Ming Xu; Sandy To, Editor(s)

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