Share Email Print

Proceedings Paper

Study of the picosecond laser damage in HfO2/SiO20based thin-film coatings in vacuum
Author(s): A. A. Kozlov; S. Papernov; J. B. Oliver; A. Rigatti; B. Taylor; B. Charles; C. Smith
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The laser damage thresholds of various HfO2/SiO2-based thin film coatings, including multilayer dielectric (MLD) gratings and high reflectors of different designs, prepared by E-beam and Plasma Ion Assisted Deposition (PIAD) methods, were investigated in vacuum, dry nitrogen, and after air-vacuum cycling. Single and multiple-pulse damage thresholds and their pulse-length scaling in the range of 0.6 to 100 ps were measured using a vacuum damage test station operated at 1053nm. The E-beam deposited high reflectors showed higher damage thresholds with square-root pulse-length scaling, as compared to PIAD coatings, which typically show slower power scaling. The former coatings appeared to be not affected by air/vacuum cycling, contrary to PIAD mirrors and MLD gratings. The relation between 1-on-1 and N-on-1 damage thresholds was found dependent on coating design and deposition methods.

Paper Details

Date Published: 13 January 2017
PDF: 7 pages
Proc. SPIE 10014, Laser-Induced Damage in Optical Materials 2016, 100141Y (13 January 2017); doi: 10.1117/12.2242832
Show Author Affiliations
A. A. Kozlov, Univ. of Rochester (United States)
S. Papernov, Univ. of Rochester (United States)
J. B. Oliver, Univ. of Rochester (United States)
A. Rigatti, Univ. of Rochester (United States)
B. Taylor, Univ. of Rochester (United States)
B. Charles, Univ. of Rochester (United States)
C. Smith, Univ. of Rochester (United States)

Published in SPIE Proceedings Vol. 10014:
Laser-Induced Damage in Optical Materials 2016
Greg J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau, Editor(s)

© SPIE. Terms of Use
Back to Top