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Proceedings Paper

An analysis of light spot extracting based on LED
Author(s): Kai Ma; Zhan Shi; Chao Chen; Xiaodong Pan; Wenbin Liu
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Paper Abstract

Light spot centroid detection is one of the key technologies in optical measurement. In order to overcome the poor stability caused by small scale spot, we proposed an extract method by using saturated light spot in this paper. By increasing the input voltage of LED and adjusting the exposure time of CCD, the image of LED which projected in the image plane become larger, it can help enhancing the stability of light spot centroid extracting. The experiment results showed that the extract stability of saturated light spot has improved obviously compared with small scale spot. This method can be adopted in close range measurement; it reflected the sub-pixel coordinate of spot in image plane coordinate more accurately after calibrating the distorted image.

Paper Details

Date Published: 25 October 2016
PDF: 8 pages
Proc. SPIE 9687, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 96870B (25 October 2016); doi: 10.1117/12.2242784
Show Author Affiliations
Kai Ma, Luoyang Institute of Electro-Optical Equipment (China)
Science and Technology on Electro-Optic Control Lab. (China)
Zhan Shi, Luoyang Institute of Electro-Optical Equipment (China)
Chao Chen, Luoyang Institute of Electro-Optical Equipment (China)
Xiaodong Pan, Luoyang Institute of Electro-Optical Equipment (China)
Wenbin Liu, Luoyang Institute of Electro-Optical Equipment (China)


Published in SPIE Proceedings Vol. 9687:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
Shinan Qian; Mourad Idir; Daniele Cocco; Tiqiao Xiao; Kazuto Yamauchi, Editor(s)

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