Share Email Print
cover

Proceedings Paper

Polishing an off-axis aspheric mirror by ion beam figuring
Author(s): Yonggang Wang; Chen Dai; Wenqin Li; Xiaohui Meng; Huiwen Dong; Peng Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Base on the special characters of off-axis spherical and three-axis ion beam figuring (IBF) system, a method of obtaining the removal function depending on incidence angles are introduced and the curve be indicated. Keeping the fabrication coordinate coincident to the optical coordinate can avoid the transformation of interferometry map, which could introduce the distortion error. By analyzing of the process of polishing the 562mm×290mm off-axis mirror, the polishing experimentation has been carried out on the IBF2000 system developed by NTG. After two iterations and 37.2 hours polishing time, the RMS value of surface accuracy is from 0.033λ to 0.016λ, and the mid-spatial error mitigated dramatically. The experimentation indicates that using the non-contacting polishing feature of IBF with reasonable optimizing process, the surface accuracy and the mid-spatial error can be improved simultaneously.

Paper Details

Date Published: 28 October 2016
PDF: 9 pages
Proc. SPIE 9683, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 96830H (28 October 2016); doi: 10.1117/12.2242718
Show Author Affiliations
Yonggang Wang, Beijing Institute of Space Mechanics and Electricity (China)
Chen Dai, Beijing Institute of Space Mechanics and Electricity (China)
Wenqin Li, Beijing Institute of Space Mechanics and Electricity (China)
Xiaohui Meng, Beijing Institute of Space Mechanics and Electricity (China)
Huiwen Dong, Beijing Institute of Space Mechanics and Electricity (China)
Peng Wang, Beijing Institute of Space Mechanics and Electricity (China)


Published in SPIE Proceedings Vol. 9683:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Wenhan Jiang; Li Yang; Oltmann Riemer; Shengyi Li; Yongjian Wan, Editor(s)

© SPIE. Terms of Use
Back to Top