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Proceedings Paper

Dark current measurements at low focal plane temperature
Author(s): L. Martineau; J. Berthoz; L. Rubaldo
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Paper Abstract

Spatial applications are challenging infrared (IR) technologies requiring the best system performances. Usually, the need is a trade-off between the spatial response and signal to noise ratio (SNR) of the IR detector, and in particular the dark current performance. Measuring dark current performances for IR detectors at low temperature require an understanding of detector physics, readout circuit design and also test equipment limitation. This paper describes possible issues associated with dark current measurements on n-on-p Mercury Cadmium Telluride (MCT) pixel design.

Paper Details

Date Published: 19 October 2016
PDF: 10 pages
Proc. SPIE 10000, Sensors, Systems, and Next-Generation Satellites XX, 100000O (19 October 2016); doi: 10.1117/12.2242570
Show Author Affiliations
L. Martineau, SOFRADIR (France)
J. Berthoz, SOFRADIR (France)
L. Rubaldo, SOFRADIR (France)


Published in SPIE Proceedings Vol. 10000:
Sensors, Systems, and Next-Generation Satellites XX
Roland Meynart; Steven P. Neeck; Toshiyoshi Kimura, Editor(s)

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