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Proceedings Paper

Performance evaluation and verification of infrared imaging system based on TTP metric
Author(s): Na Ma; Qiong Gao; Zhendong Ding; Yanxiu Zhang
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Paper Abstract

With the development of infrared focal plane array (IRFPA) technology, the high performance staring infrared imaging system has fully substituted the scanning type, and become the third generation thermal imaging system. Meanwhile the performance evaluation model associated with the device level also should be updated accordingly. This paper compares the traditional distance evaluation model with the latest model that is based on Target Task Performance (TTP) metric, and analyzes the problems and deficiencies when we evaluate a staring imaging system using the traditional model. Taking a certain type of infrared imaging equipment for example, we simulate its performances by using the two models respectively, and analyze the simulation results. Finally we verified the simulation results through field experiments, the results show that the value predicted by the model basing on the rule of TTP is closer to the measured value. This paper suggests that the TTP model is more accurate than traditional model in the design, optimization and evaluation of the high performance staring infrared imaging system.

Paper Details

Date Published: 27 September 2016
PDF: 8 pages
Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96842H (27 September 2016); doi: 10.1117/12.2242493
Show Author Affiliations
Na Ma, Luoyang Electronic Equipment Test Ctr. (China)
Qiong Gao, Luoyang Electronic Equipment Test Ctr. (China)
Zhendong Ding, Luoyang Electronic Equipment Test Ctr. (China)
Yanxiu Zhang, Luoyang Electronic Equipment Test Ctr. (China)


Published in SPIE Proceedings Vol. 9684:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Yudong Zhang; Fan Wu; Ming Xu; Sandy To, Editor(s)

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