Share Email Print
cover

Proceedings Paper

Study and analysis of catadioptric null compensating test
Author(s): Long Zhang; Wenqi Hu; Liehua Zheng; Peiming Hao
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Aiming at the concave aspheric mirror with large aperture or large relative aperture, catadioptric null compensating test is proposed. To carry out the null compensation test of concave aspheric surface, double lens and single mirror are used. The catadioptric compensator is set in front of curvature center of tested mirror. Based on third-order aberration theory, making spherical aberration coefficient S1=0, the calculating formulas of initial configuration structure parameters are derivated. This novel testing method is studied by design of catadioptirc compensators for the following three situations, the design results and drawings are given: 1) mirrors(F/2, e2=1.05) with different apertures; 2) mirrors(Φ0=2000mm, e2=1.05) with different relative apertures; 3) to design catadioptric compensators for mirror (Φ0=2000mm, e2=1.05, r0=8000mm) with different inner obscuration ratio. The analysis shows that this new method is available to test concave aspheric mirror with large aperture or large relative aperture.

Paper Details

Date Published: 27 September 2016
PDF: 7 pages
Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96842Y (27 September 2016); doi: 10.1117/12.2242492
Show Author Affiliations
Long Zhang, Shanghai Institute of Technical Physics (China)
Wenqi Hu, Shanghai Institute of Technical Physics (China)
Liehua Zheng, Shanghai Institute of Technical Physics (China)
Peiming Hao, Tongji Univ. (China)


Published in SPIE Proceedings Vol. 9684:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Yudong Zhang; Fan Wu; Ming Xu; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top