Share Email Print
cover

Proceedings Paper

Method used to test the imaging consistency of binocular camera's left-right optical system
Author(s): Meiying Liu; Hu Wang; Jie Liu; Yaoke Xue; Shaodong Yang; Hui Zhao
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

To binocular camera, the consistency of optical parameters of the left and the right optical system is an important factor that will influence the overall imaging consistency. In conventional testing procedure of optical system, there lacks specifications suitable for evaluating imaging consistency. In this paper, considering the special requirements of binocular optical imaging system, a method used to measure the imaging consistency of binocular camera is presented. Based on this method, a measurement system which is composed of an integrating sphere, a rotary table and a CMOS camera has been established. First, let the left and the right optical system capture images in normal exposure time under the same condition. Second, a contour image is obtained based on the multiple threshold segmentation result and the boundary is determined using the slope of contour lines near the pseudo-contour line. Third, the constraint of gray level based on the corresponding coordinates of left-right images is established and the imaging consistency could be evaluated through standard deviation σ of the imaging grayscale difference D (x, y) between the left and right optical system. The experiments demonstrate that the method is suitable for carrying out the imaging consistency testing for binocular camera. When the standard deviation 3σ distribution of imaging gray difference D (x, y) between the left and right optical system of the binocular camera does not exceed 5%, it is believed that the design requirements have been achieved. This method could be used effectively and paves the way for the imaging consistency testing of the binocular camera.

Paper Details

Date Published: 27 September 2016
PDF: 7 pages
Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96842R (27 September 2016); doi: 10.1117/12.2242265
Show Author Affiliations
Meiying Liu, Xi'an Institute of Optics and Precision Mechanics (China)
Hu Wang, Xi'an Institute of Optics and Precision Mechanics (China)
Jie Liu, Xi'an Institute of Optics and Precision Mechanics (China)
Yaoke Xue, Xi'an Institute of Optics and Precision Mechanics (China)
Shaodong Yang, Xi'an Institute of Optics and Precision Mechanics (China)
Hui Zhao, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 9684:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Yudong Zhang; Fan Wu; Ming Xu; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top