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Proceedings Paper

A novel method to real-time offset correction for frame transfer CCD
Author(s): Zhi Chen; Yan Wen; Dalei Yao; Baotan Jiang
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Paper Abstract

The traditional CCD offset correction processing method is to obtain normal exposure image and dark field image respectively. In the later image processing, use normal exposure image minus the dark field image. Although traditional method can offset correction, but cannot to realize real-time offset correction. Because the traditional method is to obtain offset correction after acquire normal exposure image and dark field image, while the normal exposure image and dark field image is not acquired at the same time. This method would reduce the offset correction precision. A novel method to real-time offset correction for frame transfer CCD is proposed in this paper. The method is based on the improvement of the traditional frame transfer CCD driving timing and CCD signal processing sequence. The traditional frame transfer CCD driving timing is exposure, frame transfer and read CCD level shift register. An offset correction line is added before read CCD data storage area to acquire the offset variation of the each frame image. Take it as a normal image data. In CCD signal processing algorithm to offset calculation and correction. This novel method can correct the offset of each frame image each pixel data real time. In this way the effect on the images from the variation of the offset caused by factors such as the working temperature and the aging of electronic devices in CCD signal processing circuit of CCD camera is restrained.

Paper Details

Date Published: 25 October 2016
PDF: 6 pages
Proc. SPIE 9686, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices, 96861L (25 October 2016); doi: 10.1117/12.2242264
Show Author Affiliations
Zhi Chen, Xi'an Institute of Optics and Precision Mechanics (China)
Yan Wen, Xi'an Institute of Optics and Precision Mechanics (China)
Dalei Yao, Xi'an Institute of Optics and Precision Mechanics (China)
Baotan Jiang, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 9686:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices
Yadong Jiang; Bernard Kippelen; Junsheng Yu, Editor(s)

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