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Proceedings Paper

Ballistic simulation of optical coatings deposited over topography
Author(s): R. N. Tait; S. K. Dew; Tom J. Smy; Michael J. Brett
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Paper Abstract

The use of SIMBAD, a two dimensional ballistic deposition simulation of the growth of thin films, is suggested for investigation of refractive index inhomogeneities in integrated optics devices. Refractive index variation as a function of packing fraction is obtained experimentally for evaporated MgF and sputtered SiO2 by depositing films at angles. These relationships are used to translate SIMBAD density predictions to refractive index predictions for films deposited on integrated optics topographies.

Paper Details

Date Published: 1 December 1990
PDF: 8 pages
Proc. SPIE 1324, Modeling of Optical Thin Films II, (1 December 1990); doi: 10.1117/12.22422
Show Author Affiliations
R. N. Tait, Univ. of Alberta (Canada)
S. K. Dew, Univ. of Alberta (Canada)
Tom J. Smy, Carleton Univ. (Canada)
Michael J. Brett, Univ. of Alberta (Canada)

Published in SPIE Proceedings Vol. 1324:
Modeling of Optical Thin Films II
Michael Ray Jacobson, Editor(s)

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